DocumentCode :
1698262
Title :
High reliable non-conductive adhesives for flip chip CSP applications
Author :
Myung-Jin Kim ; Hwang, Jin-Sang ; Kwon, Woon-Seong ; Jang, Kyung-Woon ; Paik, Kyung-Wook
Author_Institution :
ACA/F Div., Telephus Co., Taejon, South Korea
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
1385
Lastpage :
1389
Abstract :
Chip Scale Packages (CSP) have been adapted for mobile phones, DVC, PC cards, PDA´s and various other applications due to the robustness, cost effectiveness, and high reliability of CSP packages. For first level interconnection in CSP, wire bonding with encapsulation, Au stud bump by conductive adhesive, and solder bump interconnection with underfill process are mostly used. Non-conductive adhesives (NCA), widely used in display packaging and fine pitch flip chip packaging technology, are recommended as one of the most suitable interconnection materials for flip chip CSPs. NCA interconnection in flip chip assembly have many advantages such as easier processing, good electrical performance, lower cost, and low temperature processing. In this paper, we have developed film type NCA materials for flip chip assembly on organic substrates such as FR-4 printed circuit boards (PCBs) or BT resin. NCAs are generally a mixture of epoxy polymer resin without any fillers, and have high CTE values like conventional underfill materials used to enhance thermal cycling reliability of solder flip chip assembly on FR-4 boards. In order to reduce thermal and mechanical stress and strain induced by CTE mismatch between a chip and organic substrate, the CTE of NCAs was optimized by filler content. The modified NCA interconnection in flip chip CSP showed highly reliable interconnection when exposed to various environmental tests.
Keywords :
adhesives; assembling; chip scale packaging; circuit reliability; filled polymers; fine-pitch technology; flip-chip devices; interconnections; printed circuit manufacture; thermal expansion; BT resin; CTE mismatch; CTE optimization; FR-4 PCBs; adhesion; curing profile; electrical characteristics; environmental tests; epoxy polymer resin; filler content; film type adhesive materials; fine pitch flip chip packaging; flip chip CSPs; flip chip assembly; high reliable adhesives; high temperature humidity test; high temperature storage test; highly reliable interconnection; interconnection material; low temperature processing; material property optimization; mechanical; nonconducting silica filler; nonconductive adhesives; organic substrate; printed circuit boards; storage modulus; thermal cycling test; thermal expansion; Assembly; Chip scale packaging; Costs; Flip chip; Integrated circuit interconnections; Mobile handsets; Nonconductive adhesives; Resins; Robustness; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN :
0569-5503
Print_ISBN :
0-7803-7430-4
Type :
conf
DOI :
10.1109/ECTC.2002.1008287
Filename :
1008287
Link To Document :
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