Title :
A true 16 b self-calibrating BiCMOS DAC
Author :
Miller, G.A. ; Coln, M.C.W. ; Singer, L.A. ; Oaklander, P.R.
Author_Institution :
Analog Devices Inc., Wilmington, MA, USA
Abstract :
An instrument-grade DAC (digital-to-analog converter) that produces true 16-b performance after a brief calibration period and retains accuracy over a usable temperature range is described. Typical results for DNL (differential nonlinearity) and end-point INL (integral nonlinearity) for the 10-V unipolar range at 25 degrees C and for the calibrated top 6 b only are shown. The chip occupies 80 kmils/sup 2/ in a BiCMOS process, and dissipates 500 mW from +or-15-V/+5-V supplies.<>
Keywords :
BiCMOS integrated circuits; calibration; digital-analogue conversion; -15 to 10 V; 16 bit type; 25 degC; 500 mW; BiCMOS DAC; D/A convertor; DNL; differential nonlinearity; end-point INL; instrument-grade; integral nonlinearity; monolithic type; self-calibrating; BiCMOS integrated circuits; Calibration; Capacitors; Clocks; Linearity; Low-frequency noise; Mirrors; Read-write memory; Stress; Temperature;
Conference_Titel :
Solid-State Circuits Conference, 1993. Digest of Technical Papers. 40th ISSCC., 1993 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-0987-1
DOI :
10.1109/ISSCC.1993.280085
