DocumentCode
1698699
Title
Flux technology for lead-free alloys and its impact on cleaning
Author
Lee, Ning-Cheng ; Bixenman, Mike
Author_Institution
Indiurn Corp. of America, Clinton, NY, USA
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
1484
Lastpage
1490
Abstract
Cleaning flux residue of lead-free solder pastes is more challenging than that of Sn/Pb systems. This is primarily due to (1) higher reflow temperature, (2) higher flux capacity, therefore higher flux-induced side reactions, (3) more tin-salts formation. The cleanability decreases from no-clean soft-residue fluxes to water washable fluxes to no-clean hard residue fluxes. Improvement in cleanability may link to improvement in thermal stability of fluxes. Semi-aqueous and/or aqueous solvent sprayable cleaners yield the best cleaning efficiency, if the solvent is selected property. Spray is the most critical mechanical agitation, regardless whether it is spray-in-air or spray-under-immersion. Ultrasonic aid also imparted a significant positive effect. Saponified aqueous spray is one of the top choices for cleaning water washable residues. Better solvency and spray are the directions for further improving cleaning. Improvement in flux thermal stability will help both soldering and cleaning.
Keywords
printed circuit manufacture; reflow soldering; surface cleaning; surface mount technology; thermal stability; ultrasonic cleaning; cleanability; flux capacity; flux technology; flux-induced side reactions; lead-free alloys; lead-free solder pastes; no-clean hard residue fluxes; no-clean soft-residue fluxes; reflow temperature; saponified aqueous spray; sprayable cleaners; surface mount assembly; thermal stability; ultrasonic aid; water washable fluxes; Assembly; Chemistry; Cleaning; Environmentally friendly manufacturing techniques; Lead; Soldering; Spraying; Temperature; Thermal stability; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN
0569-5503
Print_ISBN
0-7803-7430-4
Type
conf
DOI
10.1109/ECTC.2002.1008302
Filename
1008302
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