Title :
Mitigating inductive noise in SMT processors
Author :
El-Essawy, Wael ; Albonesi, David H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA
Abstract :
Simultaneous multi-threading, although effective in increasing processor throughput, exacerbates the inductive noise problem such that more expensive electronic solutions are required even with the use of previously proposed microarchitectural approaches. We use detailed microarchitectural simulation together with the Pentium 4 power delivery model to demonstrate the impact of SMT on inductive noise, and to identify thread-specific microarchitectural reasons for high noise occurrences. We make the key observation that the presence of multiple threads actually provides an opportunity to mitigate the cyclical current fluctuations that cause noise, and propose the use of a prior performance enhancement technique to achieve this purpose.
Keywords :
circuit simulation; current fluctuations; integrated circuit design; integrated circuit modelling; integrated circuit noise; integrated circuit reliability; microprocessor chips; multi-threading; parallel architectures; Pentium 4 power delivery model; SMT processors; cyclical current fluctuations; inductive noise; microarchitectural approach; microarchitectural simulation; multiple threads; noise occurrences; performance enhancement technique; processor throughput; simultaneous multi-threading; thread-specific microarchitectural reasons; Clocks; Fluctuations; Microarchitecture; Noise level; Noise reduction; Resonance; Resonant frequency; Surface-mount technology; Voltage; Yarn;
Conference_Titel :
Low Power Electronics and Design, 2004. ISLPED '04. Proceedings of the 2004 International Symposium on
Print_ISBN :
1-58113-929-2
DOI :
10.1109/LPE.2004.1349361