• DocumentCode
    1699093
  • Title

    A systems approach to portable testers total test system integration (T2SI)

  • Author

    Rysanek, Philip ; Dilger, George ; Carr, William

  • Author_Institution
    Sanders Associates, Nashua, NH, USA
  • fYear
    1988
  • Firstpage
    107
  • Lastpage
    110
  • Abstract
    A type of systems architecture that will produce the portable automatic test equipment (ATE) to meet the growing demand for true portability and versatility is discussed. An approach to resolving the standardization issued by providing a portable test system that is generic, reprogrammable, and reconfigurable in architecture, which will allow new technology insertion regardless of the test system application, is presented. The system architecture discussed is a total test system integration or T2SI. The benefits of using a systems approach solution for portable ATE include lower life-cycle costs and shorter systems development for test applications
  • Keywords
    automatic test equipment; computer architecture; standardisation; systems engineering; ATE; life-cycle costs; portable automatic test equipment; standardization; Aerospace electronics; Aircraft; Costs; Displays; Electronic equipment testing; Life testing; Maintenance; Plugs; Standardization; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
  • Conference_Location
    Minneapolis, MN
  • Type

    conf

  • DOI
    10.1109/AUTEST.1988.9594
  • Filename
    9594
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1699093