DocumentCode :
1699184
Title :
Effect of a strip index of refraction profile on the radiation from curved rectangular dielectric waveguides
Author :
Souza, R.M.deF. ; Giarola, A.J.
Author_Institution :
Sch. of Eng. of Joinville, Univ. for the Dev. of the State of Santa Catarina, Brazil
fYear :
1989
Firstpage :
1256
Abstract :
The need in the development of optical integrated circuits for the introduction of sharper bends in the waveguides, particularly with the objective of reducing size, is addressed. Since a reduction of the curvature radius causes increased radiation with a potential increase of interaction between integrated components, it is important to search for ways of reducing this radiation. The influence of the index-of-refraction profile on the radiation from curved optical waveguides is considered as a means to achieving this. The effect of the introduction of a step index profile in the rectangular dielectric waveguide is investigated, thereby extending the analysis of E.A. Marcatili (1969) to this new class of waveguide. Expressions were obtained for the phase constants along the x and y directions of a curved rectangular dielectric waveguide with a step index of refraction profile, including the conversion coefficient between the straight and curved portions of the waveguide and the attenuation coefficient.<>
Keywords :
dielectric waveguides; integrated optics; optical waveguide theory; rectangular waveguides; refractive index; attenuation coefficient; conversion coefficient; curved optical waveguides; curved rectangular dielectric waveguides; optical integrated circuits; phase constants; radiation reduction; sharper bends; strip index of refraction profile; Attenuation; Dielectrics; Integrated optics; Optical attenuators; Optical refraction; Optical waveguide components; Optical waveguides; Photonic integrated circuits; Rectangular waveguides; Strips;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1989. AP-S. Digest
Conference_Location :
San Jose, CA, USA
Type :
conf
DOI :
10.1109/APS.1989.134938
Filename :
134938
Link To Document :
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