• DocumentCode
    1699249
  • Title

    A novel dual-polarized, wide-band microstrip patch antenna with aperture coupling

  • Author

    Gao, S.C. ; Li, L.W. ; Leong, M.S. ; Yeo, T.S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
  • Volume
    4
  • fYear
    2001
  • Firstpage
    78
  • Abstract
    A novel dual-polarized aperture-coupled microstrip patch antenna with a wide bandwidth, high isolation, low cross-polarization levels and low backward radiation levels is designed and its features are presented. The square microstrip patch is fed at two comers via the H-shaped apertures. The theoretical analysis is based on the finite-difference time-domain method. A parametric study on the input impedance of the antenna with a single input port is presented and a dual-polarized antenna is then designed, fabricated and measured. The measured return loss exhibits an impedance bandwidth of over 24.4% and the isolation between two polarization ports is better than 30 dB over the bandwidth. The cross-polarization levels in both E and H planes are better than -23 dB. The front-to-back ratio of the antenna radiation pattern is better than 22 dB.
  • Keywords
    antenna radiation patterns; electric impedance; electromagnetic wave polarisation; finite difference time-domain analysis; microstrip antennas; FDTD; H-shaped apertures; antenna radiation pattern; aperture coupling; dual-polarized antenna; finite-difference time-domain method; high isolation; impedance bandwidth; input impedance; low backward radiation levels; low cross-polarization levels; microstrip patch antenna; return loss; square microstrip patch; wide bandwidth; wideband antenna; Antenna measurements; Apertures; Bandwidth; Broadband antennas; Finite difference methods; Impedance measurement; Microstrip antennas; Parametric study; Patch antennas; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2001. IEEE
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-7070-8
  • Type

    conf

  • DOI
    10.1109/APS.2001.959404
  • Filename
    959404