• DocumentCode
    1699318
  • Title

    Interfacial fracture toughness test methodology for flip chip underfill encapsulant

  • Author

    Pang, H.L.J. ; Zhang, X.R. ; Lim, C.H. ; Shi, X.Q. ; Wang, Z.P.

  • Author_Institution
    Sch. of Mech. & Production Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    1640
  • Lastpage
    1644
  • Abstract
    An interface crack mixed mode fracture toughness test methodology has been developed in this paper. A compact mixed mode (CMM) fracture test fixture and specimen were employed. Fracture toughness tests for underfill encapsulant bonded specimens with interface cracks were subjected to a wide range of global mixed mode loading conditions. Finite element analysis modeling for an interface crack in the CMM specimen provided the necessary stress intensity factor calibration solution. The results showed that the mode II fracture toughness generally displayed a larger value than the mode I toughness. Failure criteria based on a failure analysis diagram or an effective stress intensity factor were proposed for interface cracks loaded under different mixed-mode fracture conditions.
  • Keywords
    calibration; cracks; encapsulation; flip-chip devices; fracture toughness testing; failure analysis diagram; flip chip underfill encapsulant; fracture test fixture; global mixed mode loading conditions; interface cracks; interfacial fracture toughness test; mixed mode fracture toughness test; mode I fracture toughness; mode II fracture toughness; stress intensity factor; stress intensity factor calibration; underfill encapsulant bonded specimens; Assembly; Bonding; Coordinate measuring machines; Electronics packaging; Finite element methods; Fixtures; Flip chip; Space technology; Stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2002. Proceedings. 52nd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7430-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2002.1008327
  • Filename
    1008327