Title :
Interfacial fracture toughness test methodology for flip chip underfill encapsulant
Author :
Pang, H.L.J. ; Zhang, X.R. ; Lim, C.H. ; Shi, X.Q. ; Wang, Z.P.
Author_Institution :
Sch. of Mech. & Production Eng., Nanyang Technol. Univ., Singapore, Singapore
fDate :
6/24/1905 12:00:00 AM
Abstract :
An interface crack mixed mode fracture toughness test methodology has been developed in this paper. A compact mixed mode (CMM) fracture test fixture and specimen were employed. Fracture toughness tests for underfill encapsulant bonded specimens with interface cracks were subjected to a wide range of global mixed mode loading conditions. Finite element analysis modeling for an interface crack in the CMM specimen provided the necessary stress intensity factor calibration solution. The results showed that the mode II fracture toughness generally displayed a larger value than the mode I toughness. Failure criteria based on a failure analysis diagram or an effective stress intensity factor were proposed for interface cracks loaded under different mixed-mode fracture conditions.
Keywords :
calibration; cracks; encapsulation; flip-chip devices; fracture toughness testing; failure analysis diagram; flip chip underfill encapsulant; fracture test fixture; global mixed mode loading conditions; interface cracks; interfacial fracture toughness test; mixed mode fracture toughness test; mode I fracture toughness; mode II fracture toughness; stress intensity factor; stress intensity factor calibration; underfill encapsulant bonded specimens; Assembly; Bonding; Coordinate measuring machines; Electronics packaging; Finite element methods; Fixtures; Flip chip; Space technology; Stress; Testing;
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
Print_ISBN :
0-7803-7430-4
DOI :
10.1109/ECTC.2002.1008327