Title : 
Effect of waveguide optical parameters on alignment tolerances for fibre attachment
         
        
            Author : 
Law, SH ; Poladian, L.
         
        
            Author_Institution : 
Australian Photonics CRC/ Opt. Fibre Technol. Centre, Sydney Univ., NSW, Australia
         
        
        
            fDate : 
6/24/1905 12:00:00 AM
         
        
        
        
            Abstract : 
The demands of device design often result in devices with output optical parameters significantly different to standard single mode fibre. This results in an increase in coupling loss and a greater sensitivity to misalignment even when the fibre parameters are modified to match the device. In this paper we look at the effect of the optical parameters of a rectangular planar waveguide (height, width and refractive index difference) on the coupling loss and alignment tolerance for fibre attachment. It is shown that in the case of V-groove alignment of ribbon fibre (for example), where the height deviation of fibre cores can be significantly greater than the pitch deviation and there is a channel to channel variation in bond line thickness, this can lead to significant channel to channel variation in coupling loss.
         
        
            Keywords : 
optical fibre couplers; optical planar waveguides; tolerance analysis; V-groove alignment; alignment tolerance; bond line thickness; channel-to-channel variation; coupling loss; fibre attachment; optical waveguide; rectangular planar waveguide; refractive index; ribbon fibre; standard single mode fibre; Optical design; Optical devices; Optical fiber devices; Optical fiber losses; Optical planar waveguides; Optical refraction; Optical sensors; Optical variables control; Optical waveguides; Planar waveguides;
         
        
        
        
            Conference_Titel : 
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
         
        
        
            Print_ISBN : 
0-7803-7430-4
         
        
        
            DOI : 
10.1109/ECTC.2002.1008336