DocumentCode :
1699763
Title :
Value Assessment of Workers of ON, AMKOR and HITACHI Firms in the Philippines
Author :
Clark, Eppie E.
Author_Institution :
Univ. of Warwick, Warwick
fYear :
2007
Firstpage :
2656
Lastpage :
2671
Abstract :
In this application paper, Hofstede´s framework was used to devise a survey tool that could assess the workers´ values as they work in their production teams. The survey tool was based on Hofstede´s work describing the individuals at their workplace in societies that are at either extreme of the cultural dimensions, for example high power distance versus low power distance. This list was established considering the results of other researchers´ quantitative studies and qualitative information about the workplace. The survey tool was applied to assess the worker values of the Philippine semiconductor firms ON, AMKOR and HITACHI on four value dimensions: collectivism/individualism, power distance, uncertainty avoidance and masculinity/femininity. The methodology included an initial observation during plant visits and preliminary interviews to ascertain the survey tool´s appropriateness to generate information about the values of the workforce. Finally, the survey tool was applied with the assistance of the administrative personnel.
Keywords :
gender issues; human resource management; personnel; semiconductor device manufacture; AMKOR; HITACHI; Hofstede´s framework; ON; Philippine semiconductor firms; administrative personnel; collectivism; femininity; high power distance; individualism; low power distance; masculinity; production teams; survey tool; uncertainty avoidance; worker value assessment; workplace; Counting circuits; Cultural differences; Decision making; Employment; Energy management; Humans; Personnel; Production; Resource management; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Management of Engineering and Technology, Portland International Center for
Conference_Location :
Portland, OR
Print_ISBN :
978-1-8908-4315-1
Electronic_ISBN :
978-1-8908-4315-1
Type :
conf
DOI :
10.1109/PICMET.2007.4349599
Filename :
4349599
Link To Document :
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