Solution space analysis of high speed interconnects for OC-192 applications

Author

Lu, Albert Chee W ; Fan, Wei ; Wai, Lai L. ; Iryami, F. ; Acquistapace, T.

Author_Institution

Electron. Packaging Dept., Gintic Inst. of Manuf. Technol., Singapore

fYear

2002

fDate

6/24/1905 12:00:00 AM

Firstpage

1765

Lastpage

1769

Abstract

This paper describes the application of a solution space analysis methodology to differential interconnects for FR-4 substrate material. Full-wave frequency domain electromagnetic simulations have been performed to analyse the impact of material properties and manufacturing tolerances on the performance of coupled and uncoupled differential interconnects. In addition, broadband characteristics were also extracted to analyse the signal performance across the wide frequency spectrum. Based on analysis of the simulated results, a design solution space was derived for coupled and uncoupled differential interconnects. This database can be used within the design flow to concurrently meet performance specifications and manufacturability for backplane applications.

Keywords

copper; coupled transmission lines; frequency-domain analysis; interconnections; microstrip lines; packaging; simulation; tolerance analysis; Cu; FR-4 substrate material; OC-192 applications; backplane applications; broadband characteristics; coupled interconnects; design solution space; differential interconnects; frequency domain EM simulations; full-wave electromagnetic simulations; high speed interconnects; manufacturing tolerances; material properties; signal performance; solution space analysis methodology; uncoupled interconnects; Analytical models; Backplanes; Databases; Electromagnetic analysis; Electromagnetic coupling; Frequency domain analysis; Material properties; Performance analysis; Signal analysis; Virtual manufacturing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Components and Technology Conference, 2002. Proceedings. 52nd

ISSN

0569-5503

Print_ISBN

0-7803-7430-4

Type

conf

DOI

10.1109/ECTC.2002.1008351

Filename

1008351