DocumentCode
1700480
Title
Analog VLSI Neural Network Testing
Author
Redford, M.A. ; Nagvajara, Prawat
Author_Institution
Department of Electrical and Computer, Engineering, Drexel University, Philadelphia, Pennsylvania
fYear
1993
Firstpage
825
Lastpage
831
Keywords
Application software; Artificial neural networks; Circuit faults; Circuit testing; History; Neural networks; Neurons; Supervised learning; Unsupervised learning; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Control Systems, 1993. Proceedings. The First IEEE Regional Conference on
Type
conf
DOI
10.1109/AEROCS.1993.721048
Filename
721048
Link To Document