• DocumentCode
    1700480
  • Title

    Analog VLSI Neural Network Testing

  • Author

    Redford, M.A. ; Nagvajara, Prawat

  • Author_Institution
    Department of Electrical and Computer, Engineering, Drexel University, Philadelphia, Pennsylvania
  • fYear
    1993
  • Firstpage
    825
  • Lastpage
    831
  • Keywords
    Application software; Artificial neural networks; Circuit faults; Circuit testing; History; Neural networks; Neurons; Supervised learning; Unsupervised learning; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Control Systems, 1993. Proceedings. The First IEEE Regional Conference on
  • Type

    conf

  • DOI
    10.1109/AEROCS.1993.721048
  • Filename
    721048