• DocumentCode
    1700751
  • Title

    Control systems for the nanolithography process

  • Author

    Schaper, Charles D. ; El-Awady, Khalid ; Tay, Arthur ; Kailath, Thomas

  • Author_Institution
    Inf. Syst. Lab., Stanford Univ., CA, USA
  • Volume
    4
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    4173
  • Abstract
    The lithography process is the critical step in the fabrication of nanostructures for integrated circuit manufacturing. In this paper, a summary is presented of several projects applying control and signal processing techniques to lithography. We begin with a discussion of areas in the optical exposure process where systems techniques make a significant difference. These areas include the optical mask preparation step where fast simulation methods and computational algorithms are used for mask design. Critical systems areas for next generation lithography are noted including nanopositioning by precision control of flexure systems and alignment by signal processing of laser interferometry strategies. A case study is then presented of temperature control for the postexposure bake step of sensitive chemically amplified photoresists used in deep-UV lithography
  • Keywords
    integrated circuit manufacture; light interferometry; micropositioning; nanotechnology; process control; temperature control; ultraviolet lithography; IC manufacturing; chemically amplified photoresists; computational algorithms; control systems; deep-UV lithography; integrated circuit manufacturing; laser interferometry strategies; nanolithography process; nanopositioning; nanostructure fabrication; optical exposure process; optical mask preparation; postexposure bake step; precision flexure system control; temperature control; ultraviolet lithography process; Control systems; Integrated circuit manufacture; Lithography; Nanolithography; Nanostructures; Optical device fabrication; Optical interferometry; Optical sensors; Optical signal processing; Signal processing algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1999. Proceedings of the 38th IEEE Conference on
  • Conference_Location
    Phoenix, AZ
  • ISSN
    0191-2216
  • Print_ISBN
    0-7803-5250-5
  • Type

    conf

  • DOI
    10.1109/CDC.1999.828016
  • Filename
    828016