DocumentCode
1700751
Title
Control systems for the nanolithography process
Author
Schaper, Charles D. ; El-Awady, Khalid ; Tay, Arthur ; Kailath, Thomas
Author_Institution
Inf. Syst. Lab., Stanford Univ., CA, USA
Volume
4
fYear
1999
fDate
6/21/1905 12:00:00 AM
Firstpage
4173
Abstract
The lithography process is the critical step in the fabrication of nanostructures for integrated circuit manufacturing. In this paper, a summary is presented of several projects applying control and signal processing techniques to lithography. We begin with a discussion of areas in the optical exposure process where systems techniques make a significant difference. These areas include the optical mask preparation step where fast simulation methods and computational algorithms are used for mask design. Critical systems areas for next generation lithography are noted including nanopositioning by precision control of flexure systems and alignment by signal processing of laser interferometry strategies. A case study is then presented of temperature control for the postexposure bake step of sensitive chemically amplified photoresists used in deep-UV lithography
Keywords
integrated circuit manufacture; light interferometry; micropositioning; nanotechnology; process control; temperature control; ultraviolet lithography; IC manufacturing; chemically amplified photoresists; computational algorithms; control systems; deep-UV lithography; integrated circuit manufacturing; laser interferometry strategies; nanolithography process; nanopositioning; nanostructure fabrication; optical exposure process; optical mask preparation; postexposure bake step; precision flexure system control; temperature control; ultraviolet lithography process; Control systems; Integrated circuit manufacture; Lithography; Nanolithography; Nanostructures; Optical device fabrication; Optical interferometry; Optical sensors; Optical signal processing; Signal processing algorithms;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 1999. Proceedings of the 38th IEEE Conference on
Conference_Location
Phoenix, AZ
ISSN
0191-2216
Print_ISBN
0-7803-5250-5
Type
conf
DOI
10.1109/CDC.1999.828016
Filename
828016
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