Title : 
Technique for preparing defect-free spray coated resist film
         
        
            Author : 
Kumar Singh, V. ; Sasaki, M. ; Jong Hyeong Song ; Hane, K.
         
        
            Author_Institution : 
Dept. of Mechatronics & Precision Eng., Tohoku Univ., Sendai, Japan
         
        
        
        
        
            Abstract : 
Up to now some 3-D (three-dimensional) devices have been demonstrated using the spray coating of photoresist. Since the detail of the technical performance is not clear, the spray coating technique is still in its infancy. In this study, a technique for preparing the defect-free spray coated resist film is described. A solvent (thinner) vapor is used to fill the pinhole assisting the resist flow. Since this flow is generated by the surface tension, it degrades the uniformity of the resist film on the cavity by decreasing the thickness at convex corner. The balance between the removing effect of pinholes and the thinning effect at convex corners is examined finding the appropriate condition.
         
        
            Keywords : 
elemental semiconductors; optical scanners; photoresists; semiconductor growth; semiconductor thin films; silicon; spray coating techniques; spray coatings; surface tension; Si; convex corner; defect-free spray coated resist film; pinhole filling; resist flow; surface tension; thinning effect; Coatings; Degradation; Lithography; Mechatronics; Optical films; Resists; Spraying; Surface tension; Temperature control; Thickness measurement;
         
        
        
        
            Conference_Titel : 
TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
         
        
            Conference_Location : 
Boston, MA, USA
         
        
            Print_ISBN : 
0-7803-7731-1
         
        
        
            DOI : 
10.1109/SENSOR.2003.1215599