DocumentCode
1700868
Title
IEE Colloquium on `Mixed Signal VLSI Test´ (Digest No.1993/240)
fYear
1993
fDate
12/13/1993 12:00:00 AM
Abstract
The following topics were dealt with: board level test; test methodologies; testability analysis; BIST; and mixed-mode simulation
Keywords
VLSI; built-in self test; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; printed circuit testing; BIST; IC testing; PC testing; VLSI; board level test; mixed-mode simulation; test methodologies; testability analysis;
fLanguage
English
Publisher
iet
Conference_Titel
Mixed Signal VLSI Test, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
280219
Link To Document