• DocumentCode
    1700900
  • Title

    Phase noise in a synchronized concurrent dual-frequency oscillator

  • Author

    Goel, Ankush ; Hashemi, Hossein

  • Author_Institution
    Dept. of Electr. Eng. - Electrophys., Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    2009
  • Firstpage
    483
  • Lastpage
    486
  • Abstract
    The phase noise in synchronized concurrent dual-frequency oscillators is analyzed. Two cases are considered -synchronization to external injection sources and synchronization in array of coupled identical oscillators. For small injection strengths, the phase noise behavior of synchronized concurrent dual-frequency oscillators at either of the frequencies is similar to that of synchronized single frequency oscillators. The phase noise of an injection locked concurrent dual-frequency oscillator for either of the frequencies follows the phase noise of external injection near that frequency for offsets within the locking bandwidth of the injection. For offsets outside of the locking bandwidth, the injection locked oscillator´s phase noise is equal to that of free running case. In the system of two coupled concurrent dual-frequency oscillators with bilateral coupling, the phase noise at either frequency is 3 dB smaller than that at the free running case for offsets smaller than the locking bandwidth. Measurement results show a good match with the theory.
  • Keywords
    analogue integrated circuits; injection locked oscillators; phase noise; bilateral coupling; free running case; injection locked; injection sources; locking bandwidth; phase noise; small injection strengths; synchronized concurrent dual-frequency oscillator; Analog integrated circuits; Bandwidth; Clocks; Coupling circuits; Frequency synchronization; Injection-locked oscillators; Integrated circuit measurements; Nonlinear systems; Phase noise; Phased arrays; Analog integrated circuits; Nonlinear systems; Oscillators; Phase noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-4071-9
  • Electronic_ISBN
    978-1-4244-4073-3
  • Type

    conf

  • DOI
    10.1109/CICC.2009.5280789
  • Filename
    5280789