• DocumentCode
    170115
  • Title

    Improving polynomial datapath debugging with HEDs

  • Author

    Sadeghi-Kohan, Somayeh ; Behnam, Payman ; Alizadeh, Behrooz ; Fujita, Masayuki ; Navabi, Zainalabedin

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
  • fYear
    2014
  • fDate
    26-30 May 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper, we introduce a formal and scalable debugging approach to derive a reduced ordered set of design error candidates in polynomial datapath designs. To make our debugging method scalable for large designs, we utilize a Modular Horner Expansion Diagram (M-HED), which has been shown to be a scalable high level decision model. In our method, we extract data dependency graphs from the polynomial datapath designs using static slicing. Then we combine backward and forward path tracing to extract a reduced set of error candidates. In order to increase the accuracy of the method in the presence of multiple design errors, we rank the error candidates in decreasing order of their probability of being an error using a proposed priority criterion. In order to evaluate the effectiveness of our method, we have applied it to several large designs. The experimental results show that the proposed method enables us to locate even multiple errors with high accuracy in a short run time.
  • Keywords
    computer debugging; formal verification; graph theory; polynomials; probability; program slicing; M-HED; backward path tracing; data dependency graph extraction; design error candidates; formal debugging approach; forward path tracing; modular horner expansion diagram; polynomial datapath debugging improvement; polynomial datapath designs; scalable debugging approach; scalable high level decision model; static slicing; Accuracy; Benchmark testing; Computer bugs; Debugging; Educational institutions; Hardware design languages; Polynomials; Debugging; Error Ranking; HED; RTL; Verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2014 19th IEEE European
  • Conference_Location
    Paderborn
  • Type

    conf

  • DOI
    10.1109/ETS.2014.6847797
  • Filename
    6847797