• DocumentCode
    1701294
  • Title

    A high dynamic range ASK demodulator for passive UHF RFID with automatic over-voltage protection and detection threshold adjustment

  • Author

    Balachandran, Ganesh K. ; Barnett, Raymond E.

  • Author_Institution
    Texas Instrum., Inc., Dallas, TX, USA
  • fYear
    2009
  • Firstpage
    383
  • Lastpage
    386
  • Abstract
    This paper presents a passive UHF RFID ASK demodulator that operates over a +24 dBm to -14 dBm RF input power range. The demodulator automatically adjusts between high sensitivity mode for weak RF signal power and over-voltage protection mode for high RF power. The input over-voltage protection circuit is designed to protect the IC from high input power while not impacting the sensitivity at weak input power. The demodulator is comprised of a RF rectifier, a variable gain attenuator with automatic threshold adjustment and a nano-power data slicer. The demodulator handles demodulating signals with a minimum to maximum envelope ratio of 0.8 over the entire input power range, and the data slicer consumes only 160 nA from a 0.9 to 1.25 V rectified supply. The RFID chip is fabricated in a 0.13 mum analog-CMOS technology and the entire chip occupies an area of 0.55 mm2.
  • Keywords
    CMOS analogue integrated circuits; amplitude shift keying; demodulators; radiofrequency identification; RF input power range; RF rectifier; analog-CMOS technology; automatic over-voltage protection; demodulator automatically adjusts; detection threshold adjustment; high dynamic range ASK demodulator; high sensitivity mode; nano-power data slicer; over-voltage protection mode; passive UHF RFID; rectified supply; variable gain attenuator; voltage 0.9 V to 1.25 V; Amplitude shift keying; Circuits; Demodulation; Dynamic range; Gain; Passive RFID tags; Protection; Radio frequency; Radiofrequency identification; Rectifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-4071-9
  • Electronic_ISBN
    978-1-4244-4073-3
  • Type

    conf

  • DOI
    10.1109/CICC.2009.5280804
  • Filename
    5280804