Title :
Preliminary experiments for power supply noise reduction using stubs
Author :
Nakura, Tom ; Ikeda, Makoto ; Asada, Kunihiro
Author_Institution :
Dept. of Electron. Eng., Univ. of Tokyo, Japan
Abstract :
This paper demonstrates a power supply noise reduction using stubs. A quarter-length stub attached to the power supply line of an LSI chip works as a band-eliminate filter, and suppresses the power supply noise of the designed frequency. Preliminary experiments show that 90% of the designed frequency noise component is suppressed when off-chip stubs are attached to a power supply pin of a 1.15GHz operating LSI. The results show the possibility of the stub on-chip integration when the operating frequency of LSIs becomes higher and the stub length becomes shorter.
Keywords :
CMOS logic circuits; band-stop filters; combinational circuits; large scale integration; power supply circuits; random noise; LSI chip; band-eliminate filter; characteristic impedance; combination logic; frequency noise component; inverter chain; off-chip stubs; on-chip integration; power supply noise reduction; pseudo random bit stream generation circuit; quarter-length stub; standard CMOS technology; stub length; Capacitors; Circuit testing; Frequency; Impedance; Large scale integration; Noise generators; Noise reduction; Power supplies; Power transmission lines; Transmission line theory;
Conference_Titel :
Advanced System Integrated Circuits 2004. Proceedings of 2004 IEEE Asia-Pacific Conference on
Print_ISBN :
0-7803-8637-X
DOI :
10.1109/APASIC.2004.1349473