DocumentCode :
170182
Title :
Automatic correction of certain design errors using mutation technique
Author :
Behnam, Payman ; Alizadeh, Behrooz ; Navabi, Zainalabedin
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
fYear :
2014
fDate :
26-30 May 2014
Firstpage :
1
Lastpage :
2
Abstract :
In this paper, we introduce a new technique that makes use of satisfiability (SAT) based debugging techniques along with a mutation-based technique to correct certain design errors in digital designs automatically. The experimental results demonstrate that our proposed method enables us to locate and correct multiple bugs by targeting gate replacements and wire exchanging within reasonable run-time and memory usage for several designs.
Keywords :
computability; logic design; program debugging; SAT based debugging techniques; bug correction; bug location; design error correction; digital designs; gate replacements; mutation-based technique; satisfiability; wire exchange; Computer bugs; Debugging; Educational institutions; Logic gates; Memory management; Polynomials; Wires; correction; debugging; mutation; satisfiability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ETS), 2014 19th IEEE European
Conference_Location :
Paderborn
Type :
conf
DOI :
10.1109/ETS.2014.6847833
Filename :
6847833
Link To Document :
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