DocumentCode
1702149
Title
Fast integral equation based analysis of transient electromagnetic scattering from three-dimensional inhomogeneous lossy dielectric objects
Author
Shanker, B. ; Aygun, K. ; Gres, N. ; Michielssen, E.
Author_Institution
Dept. ECpE, Iowa State Univ., Ames, IA, USA
Volume
4
fYear
2001
Firstpage
532
Abstract
This paper presents a fast scheme for studying transient scattering from and propagation through inhomogeneous lossy dielectric bodies. The analysis of fields in lossy media has diverse applications ranging from the study of skin effects in high-speed circuits to medical diagnostics to the analysis of interactions between antennas and biological media. Moreover, transient analysis methods are ideal for studying non-linear effects. This paper presents an accelerated marching-on-in-time (MOT) scheme to solve time domain volume integral equations pertinent to the study of lossy dielectrics. The classical solution scheme (MOT) is augmented with the plane wave time domain (PWTD) scheme, which leads to a considerable reduction in computational complexity.
Keywords
absorbing media; dielectric bodies; electromagnetic wave propagation; electromagnetic wave scattering; inhomogeneous media; integral equations; time-domain analysis; transient analysis; 3D inhomogeneous lossy dielectric objects; antennas; biological media; computational complexity reduction; fast integral equation; high-speed circuits; inhomogeneous lossy dielectric bodies; marching-on-in-time scheme; medical diagnostics; nonlinear effects; plane wave time domain scheme; three-dimensional inhomogeneous lossy dielectric objects; time domain volume integral equations; transient electromagnetic propagation; transient electromagnetic scattering; Circuits; Dielectric losses; Electromagnetic analysis; Electromagnetic propagation; Electromagnetic scattering; Electromagnetic transients; Integral equations; Propagation losses; Skin effect; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2001. IEEE
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7070-8
Type
conf
DOI
10.1109/APS.2001.959517
Filename
959517
Link To Document