DocumentCode :
1702211
Title :
Electron and photon responses of Gd2SiO5(Ce3+) and BaF2
Author :
Mengesha, W. ; Taulbee, T.B. ; Valentine, J.D. ; Rooney, B.D.
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
1
fYear :
2001
Firstpage :
359
Abstract :
Gd2SiO5(Ce3+) (GSO) and BaF2 electron responses were characterized using the Compton Coincidence Technique (CCT). The CCT has been used previously to characterize several scintillators and has proven to be an accurate and reliable technique. The GSO measured electron response was observed to increase by 28% as the electron energy increased from 5 keV to 445 keV. BaF2 measured electron response increased by 22% as the electron energy increased from 18 keV to 436 keV. The observations made with GSO and BaF2 in this study are consistent with the general trend reported for previously characterized non-alkali halide scintillators. The GSO and BaF2 measured electron responses were further used to calculate their respective photon responses. MCNP4C together with simplified electron cascade sequences for GSO and BaF2 were used in these photon responses calculations. Calculated photon responses for both crystals are in good agreement with measured photon responses. This agreement confirms the accuracy of the GSO and BaF2 measured electron responses.
Keywords :
barium compounds; cerium; coincidence techniques; electron detection; gadolinium compounds; gamma-ray detection; high energy physics instrumentation computing; position sensitive particle detectors; solid scintillation detectors; BaF2; CCT; Compton coincidence technique; GSO; Gd2SiO5:Ce3+; MCNP4C; electron cascade sequence; electron response; halide scintillators; light yield; photon response; scintillator nonproportionality; scintillators; Current measurement; Detectors; Electromagnetic wave absorption; Electrons; Energy measurement; Instruments; Laboratories; Occupational safety; Photonic crystals; Telephony;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2001 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-7324-3
Type :
conf
DOI :
10.1109/NSSMIC.2001.1008476
Filename :
1008476
Link To Document :
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