Title :
Analysis of fitted Suns-Voc curves using two-diode model
Author :
Sulaiman, Shahril Irwan
Author_Institution :
Fac. of Electr. Eng., Univ. Teknologi MARA, Selangor, Malaysia
Abstract :
The light intensity vs open circuit voltage (Suns-Voc) measurement technique has been extensively used in characterising nonmetallised thin film silicon solar cells. Unlike the short circuit current vs open circuit voltage (Isc-Voc) measurement, Suns-Voc presents a great advantage by operating in a simple quasi-steady-state. Because the equipment used in Suns-Voc is far less complex than the equipment used in the normal lsc-Voc measurement, it is a very practical method to promptly determine the open circuit voltage (Voc) of solar cells, especially during the initial processing steps. Using this technique, the one-sun open circuit voltage data and other relevant parameters were extracted from a Suns-Voc spreadsheet while a fitted Suns-Voc curve was used as a standard graphical reference for analysing the Suns-Voc results. As Suns-Voc results were recorded after each process, the properties of a solar cell such as shunt and two-diode model behaviour could be tracked down quickly when required. By integrating all the results from each measurement done, necessary interpretation of solar cell´s performance could be made. A distinct advantage is that the measurement can be done at most fabrication sequence even before a solar cell is metallised. In this paper, fitted Suns-Voc curves are analysed to extract the diode properties of silicon solar cells.
Keywords :
curve fitting; elemental semiconductors; semiconductor device models; semiconductor diodes; silicon; solar cells; diode properties; light intensity; nonmetallised thin film; open circuit voltage; shunt behaviour; silicon solar cells; standard graphical reference; two-diode model; Current measurement; Data mining; Fabrication; Measurement techniques; Photovoltaic cells; Semiconductor thin films; Short circuit currents; Silicon; Thin film circuits; Voltage;
Conference_Titel :
Semiconductor Electronics, 2004. ICSE 2004. IEEE International Conference on
Print_ISBN :
0-7803-8658-2
DOI :
10.1109/SMELEC.2004.1620853