Title :
A study on signature analyzer for design for test (DFT)
Author :
A´ain, Abu Khari Bin ; Lim, Chek T. ; Hong, Ng Kok ; Kwang, Ng Sheng ; Yew, Liew Eng
Author_Institution :
Dept. of Electron., Univ. Teknologi Malaysia, Johor, Malaysia
Abstract :
This paper takes a look at the use of linear feedback shift registers (LFSRs) as test pattern generators (TPGs) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences of the same set of test patterns.
Keywords :
automatic test equipment; built-in self test; design for testability; random number generation; built-in self-test; design for test; linear feedback shift registers; pseudorandom test patterns; signature analyzer; test pattern generators; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Design for testability; Linear feedback shift registers; Pattern analysis; System testing; Test pattern generators; ATPG; BIST; LFSR; PRBS;
Conference_Titel :
Semiconductor Electronics, 2004. ICSE 2004. IEEE International Conference on
Print_ISBN :
0-7803-8658-2
DOI :
10.1109/SMELEC.2004.1620855
