Title :
Design and application of parallel digital signal processor based image processing system for industrial inspection
Author :
Kshirsagar, S.P. ; Hartley, D.A. ; Harvey, D.M. ; Hobson, C.A.
Author_Institution :
Sch. of Electr. & Electron. Eng., Liverpool John Moores Univ., UK
fDate :
2/1/1994 12:00:00 AM
Abstract :
The use of computer-based inspection systems in industrial environments is becoming more common due to the fact that they produce consistent results compared to traditional methods of inspection. In certain manufacturing applications, the inspection of the product may become a bottleneck. This is caused by the large amount of data that has to be processed in conjunction with high computational requirements. In order to deliver the desired throughput rates required typically necessitates the use of specialised hardware. The Coherent and Electro-optics Research Group at LJMU currently has several inspection applications which require computational rates considerably higher than can be achieved using commodity systems. A parallel digital signal processor (DSP) based image processing system is being developed which will resolve the current computational deficiency
Keywords :
computer vision; digital signal processing chips; image processing; inspection; parallel architectures; DSP; computer-based inspection systems; high computational requirements; image processing system; industrial environments; industrial inspection; manufacturing applications; parallel digital signal processor; specialised hardware; throughput rates;
Conference_Titel :
High Performance Applications of Parallel Architectures, IEE Colloquium on
Conference_Location :
London