• DocumentCode
    1702424
  • Title

    Angle sensitive pixels in CMOS for lensless 3D imaging

  • Author

    Wang, Albert ; Gill, Patrick ; Molnar, Alyosha

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
  • fYear
    2009
  • Firstpage
    371
  • Lastpage
    374
  • Abstract
    We present a pixel-scale CMOS sensor for near-field, lensless 3D imaging. This angle-sensitive pixel (ASP) uses local, stacked diffraction gratings over a photodiode to discriminate the incident angle of incoming light. The ASPs, measuring 20 mum wide and 40 mum long, have been built in an unmodified 130 nm CMOS process. Metal wiring layers provide the required gratings, while intrinsic pn-junctions act as photodiodes. We present operating principles and design considerations of the ASP, as well as results demonstrating desired angle sensitivity. Arrays of ASPs enable lensless microscale imaging that reconstructs the 3-dimensional structure of light sources.
  • Keywords
    CMOS image sensors; diffraction gratings; image reconstruction; photodiodes; ASP array; angle-sensitive pixel design; image reconstruction; lensless microscale imaging; light source three-dimensional structure; metal wiring layers; photodiodes; pixel-scale CMOS image sensor; size 130 nm; size 20 nm; size 40 nm; stacked diffraction grating; Application specific processors; CMOS image sensors; CMOS process; Diffraction gratings; Image reconstruction; Light sources; Optical arrays; Photodiodes; Pixel; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-4071-9
  • Electronic_ISBN
    978-1-4244-4073-3
  • Type

    conf

  • DOI
    10.1109/CICC.2009.5280840
  • Filename
    5280840