Title :
Novel modelling for high-field current-voltage characteristics of semiconducting varistors
Author :
Mahmud, Shahrom ; Abdullah, Mat Johar ; Amin, Zakaria Mohd ; Babu, S.P.K.
Author_Institution :
Sch. of Phys., Univ. of Sci., Penang, Malaysia
Abstract :
In this work, the current-voltage property at a high electric field region (1000V/cm, 1000A/cm2) is described. From the relationship among average power dissipation (P), upturn nonlinear coefficient (αup) and ZnO grain resistivity (ρgr, a new current-voltage equation is derived (upturn equation) and four constants are found. A generic form of this equation is α = SRup+ ci where S is the upturn power constant, Rup is the upturn resistance at 1000A/cm2 and ci is the ideal constant. In this high-field region, also known as upturn region, the current-voltage characteristic is almost ohmic whereby the αup values are less than 5. Due to the diminished Schottky barrier in the upturn region, ZnO grains play the key role in determining the I-V characteristics. SEM micrograph photos of the starting ZnO powder show presence of intrinsic defects (ID) in the form of irregularly-shaped microclusters of nanocrystallites 40nm-300nm in size. A new model is introduced to describe the impact of these ID on the power dissipation in the I-V upturn region. It is believed that charge carriers are trapped in the potential wells created by ID, and when they are annihilated by opposite charges, thermal energy is dissipated. The fabricated ZnO varistors, categorised as low-voltage models (≤17Vrms), can be used as external surge protection devices (SPDs) for microprocessor-controlled equipment.
Keywords :
Schottky barriers; nanostructured materials; semiconductor device models; varistors; zinc compounds; 40 to 300 nm; SEM micrograph photos; Schottky barrier; ZnO; ZnO grain resistivity; ZnO powder; charge carriers; current-voltage equation; current-voltage property; high electric field region; high-field current-voltage characteristics; intrinsic defects; irregularly-shaped microclusters; microprocessor-controlled equipment; nanocrystallites; potential wells; semiconducting varistors; surge protection devices; thermal energy; upturn equation; upturn region; Conductivity; Current-voltage characteristics; Nonlinear equations; Numerical analysis; Power dissipation; Schottky barriers; Semiconductivity; Strontium; Varistors; Zinc oxide;
Conference_Titel :
Semiconductor Electronics, 2004. ICSE 2004. IEEE International Conference on
Print_ISBN :
0-7803-8658-2
DOI :
10.1109/SMELEC.2004.1620861