DocumentCode :
1702612
Title :
Intrinsic Capacitances Computation Of Semiconductor Multi Electrodes Devices
Author :
Mottet, S. ; Viallet, J.E.
Author_Institution :
Centre National d´´Etudes des Telecommunications
fYear :
1987
Firstpage :
289
Lastpage :
294
Abstract :
Steady state simulation of silicon and IU-IZ devices are performed by solving the general set of equation (eventually completed by energy conservation equation. Using finite difference (FD) or finite element methods (FEM), the resolution gives the device terminal currents with accuracy. But as the internal capacitances of the device are concerned, a general quasi-static method to determine the capacitances of multielectrode stuctures is desirable. Such a method should not call for any specific consideration over geometry or conduction behavior, so as to be included in a universal simulation code.
Keywords :
Capacitance measurement; Charge measurement; Conductors; Current measurement; Density measurement; Dielectrics; Difference equations; Electrodes; Schottky diodes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Numerical Analysis of Semiconductor Devices and Integrated Circuits, 1987. NASECODE V. Proceedings of the Fifth International Conference on the
Conference_Location :
Dublin, Ireland
Print_ISBN :
0-906783-72-0
Type :
conf
DOI :
10.1109/NASCOD.1987.721194
Filename :
721194
Link To Document :
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