• DocumentCode
    1702730
  • Title

    SiGe digital frequency dividers with reduced residual phase noise

  • Author

    Horst, Stephen ; Phillips, Stan ; Lavasani, Hossein ; Ayazi, Farrokh ; Cressler, John D.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2009
  • Firstpage
    251
  • Lastpage
    254
  • Abstract
    A new design methodology for achieving very low residual phase noise in SiGe HBT digital frequency dividers is presented. A modified CML D latch design is proposed that enables the latch to draw more current, thereby reducing the residual phase noise. The latch modification yields a 10 dB phase noise improvement over a standard D latch topology, with measurements at 10 GHz resulting in a phase noise floor of - 160 dBc/Hz. The circuit dissipates 350 mW of DC power, but a standard phase noise figure-of-merit that accounts for phase noise, DC power dissipation, and operating frequency, reveals that this new design is among the best in its class.
  • Keywords
    Ge-Si alloys; MMIC frequency convertors; bipolar MMIC; bipolar digital integrated circuits; frequency dividers; heterojunction bipolar transistors; integrated circuit noise; logic design; phase noise; DC power dissipation; HBT digital frequency dividers; SiGe; flip-flop topology; frequency 10 GHz; modified CML D latch design; noise figure 10 dB; residual phase noise; Circuit topology; Design methodology; Frequency conversion; Germanium silicon alloys; Heterojunction bipolar transistors; Latches; Measurement standards; Noise measurement; Phase noise; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-4071-9
  • Electronic_ISBN
    978-1-4244-4073-3
  • Type

    conf

  • DOI
    10.1109/CICC.2009.5280851
  • Filename
    5280851