Title :
SiGe digital frequency dividers with reduced residual phase noise
Author :
Horst, Stephen ; Phillips, Stan ; Lavasani, Hossein ; Ayazi, Farrokh ; Cressler, John D.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
A new design methodology for achieving very low residual phase noise in SiGe HBT digital frequency dividers is presented. A modified CML D latch design is proposed that enables the latch to draw more current, thereby reducing the residual phase noise. The latch modification yields a 10 dB phase noise improvement over a standard D latch topology, with measurements at 10 GHz resulting in a phase noise floor of - 160 dBc/Hz. The circuit dissipates 350 mW of DC power, but a standard phase noise figure-of-merit that accounts for phase noise, DC power dissipation, and operating frequency, reveals that this new design is among the best in its class.
Keywords :
Ge-Si alloys; MMIC frequency convertors; bipolar MMIC; bipolar digital integrated circuits; frequency dividers; heterojunction bipolar transistors; integrated circuit noise; logic design; phase noise; DC power dissipation; HBT digital frequency dividers; SiGe; flip-flop topology; frequency 10 GHz; modified CML D latch design; noise figure 10 dB; residual phase noise; Circuit topology; Design methodology; Frequency conversion; Germanium silicon alloys; Heterojunction bipolar transistors; Latches; Measurement standards; Noise measurement; Phase noise; Silicon germanium;
Conference_Titel :
Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-4071-9
Electronic_ISBN :
978-1-4244-4073-3
DOI :
10.1109/CICC.2009.5280851