DocumentCode
1702892
Title
Electro-Optic Sampling Of High-speed III-V Devices And ICS
Author
Jain, R.K.
Author_Institution
Amoco Research Center
fYear
1987
Firstpage
22
Lastpage
34
Keywords
Electrooptic devices; HEMTs; High speed optical techniques; III-V semiconductor materials; MODFETs; Optical pulses; Optical sensors; Pulse measurements; Sampling methods; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
High Speed Semiconductor Devices and Circuits, 1987. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
Conference_Location
Ithaca, NY, USA
Type
conf
DOI
10.1109/CORNEL.1987.721210
Filename
721210
Link To Document