Title :
Resolving gigabit at-speed failure analysis using current-resistance (I/R) analysis
Author_Institution :
Intel Technol., Penang, Malaysia
Abstract :
If there is a technique to manipulate the electrical components to achieve higher speed circuitry design, there should be a technique to access and debug the components reside in the circuitry as well. The current-resistance (I/R) analysis is the one. This paper introduces the debugging methodology used in performing failure analysis and fault isolation for 90-nanometer technology gigabit at-speed functional failure. Current-resistance (I/R) analysis is the exact approach to tackle the challenge of debugging the performance of gigabit high-speed signal due to the fluctuation characteristic of the passive components. Accurate result was obtained with the aid of SQUID equipment.
Keywords :
failure analysis; high-speed integrated circuits; integrated circuit reliability; integrated circuit testing; nanotechnology; 90 nm; SQUID equipment; current-resistance analysis; debugging methodology; electrical components; failure analysis; fault isolation; fluctuation characteristic; high-speed signal; higher speed circuitry design; passive components; Circuit faults; Circuit testing; Coupling circuits; Debugging; Driver circuits; Electrostatic discharge; Failure analysis; Isolation technology; Pins; Voltage;
Conference_Titel :
Semiconductor Electronics, 2004. ICSE 2004. IEEE International Conference on
Print_ISBN :
0-7803-8658-2
DOI :
10.1109/SMELEC.2004.1620876
