DocumentCode :
1703419
Title :
The surface site dehydration mechanism for Si3N4 sensing membrane by post-baking treatment
Author :
Lai, Chao-Sung ; Yang, Chia-Ming ; Chih-Yao Wang ; Cheng-En Lue ; Lue, Cheng-En ; Ko, Hung-Pin ; Wang, Chih-Yao
Author_Institution :
Dept. of Electron. Eng., Chang Gung Univ., Tao-Yuan, Taiwan
fYear :
2004
Abstract :
This work presented a post-baking treatment effect on Si3N4 sensing membrane for the pH response. Special measurement sequences were proposed to verify the surface site activation and de-hydration. Sensitivity was improved by pH4 buffer solution immersion. However, sensitivities were decreased 3-8.5 mV/pH and 1-2.8mV/pH by first and second baking cycle respectively. Higher baking temperature made the sensitivity decrease more. It was due to ion and surface site exchange and repaired the dangling bond on sensing membrane during buffer immersion. The post-baking treatment broke some active sites by thermal energy. The higher baking temperature provided more thermal energy to break active sites and degrade more sensitivity. A novel physical model was proposed for the activation and dehydration behavior.
Keywords :
chemical sensors; heat treatment; ion exchange; pH measurement; sensitivity; silicon compounds; surface chemistry; Si3N4; buffer solution immersion; ion exchange; pH response; post-baking treatment effect; silicon nitride sensing membrane; surface site activation; surface site dehydration mechanism; surface site exchange; thermal energy; Biomembranes; Bonding; Capacitance-voltage characteristics; Chaos; Pressure measurement; Silicon; Surface treatment; Temperature sensors; Thermal degradation; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Electronics, 2004. ICSE 2004. IEEE International Conference on
Print_ISBN :
0-7803-8658-2
Type :
conf
DOI :
10.1109/SMELEC.2004.1620892
Filename :
1620892
Link To Document :
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