• DocumentCode
    170360
  • Title

    Recognition method for control chart patterns based on improved sequential forward selection and extreme learning machine

  • Author

    Yubo Zhang ; Xiaonan Lin

  • Author_Institution
    Coll. of Electr. Eng., Zhengzhou Univ., Zhengzhou, China
  • fYear
    2014
  • fDate
    16-18 May 2014
  • Firstpage
    79
  • Lastpage
    82
  • Abstract
    Control chart is one of the important statistical process control tools. Abnormal situations and the potential quality problems in the production process can be judged and revealed according to the state of control chart. Thus the recognition of control chart is of great importance. To improve patterns recognition performance of control chart, a new method based on improved sequential forward selection (ISFS) and extreme learning machine (ELM) was presented. Firstly the 13 time domain features were extracted from control chart; secondly, the improved sequential forward selection method was used to select the features to reduce the relevance and redundancy between features and improve recognition rate; finally, ELM was adopted to identify control chart. Experimental results show that the proposed method can achieve a significant classification performance with accuracy of 98.7%, providing a new method for the control chart recognition.
  • Keywords
    control charts; feature extraction; feedforward neural nets; learning (artificial intelligence); production engineering computing; ELM; classification performance; control chart pattern recognition method; extreme learning machine; feed forward neural network algorithm; improved sequential forward selection; production process; recognition rate; statistical process control tools; time domain feature extraction; Accuracy; Control charts; Feature extraction; Market research; Pattern recognition; Support vector machines; Training; control chart; extreme learning machine; pattern recognition; sequential forward selection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Progress in Informatics and Computing (PIC), 2014 International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4799-2033-4
  • Type

    conf

  • DOI
    10.1109/PIC.2014.6972300
  • Filename
    6972300