The method of auxiliary sources in scattering and diffraction problems

The approach for solving diffraction problems upon the large conducting scatterers with apertures is presented in this paper. The solution is based on the method of auxiliary sources (MAS). The idea is to introduce the two domains, inside and outside the object where the field is calculated by two different sets of unknowns. Together with necessary boundary conditions the continuity of the electric and magnetic field is enforced on the surfaces representing the holes or apertures. This method allows the describing the large part of scatterer by fewer unknowns compared to conventional methods like MoM.