• DocumentCode
    1703650
  • Title

    Validation of USB peripheral checklist a challenging requirement for SoC

  • Author

    Pandey, Maneesh Kumar ; Jain, Neeraj ; Sinha, Amit ; Shekhar, Shwetank

  • Author_Institution
    Freescale Semicond. Pvt Ltd., Noida, India
  • fYear
    2013
  • Firstpage
    203
  • Lastpage
    206
  • Abstract
    As of now semiconductor companies only ensure peripheral checklist in design and perform compliance testing at silicon. Compliance tests are essential to verify if design targets are met according to the planned specification. USB implementer´s forum (USB-IF) has instituted a compliance program which provides reasonable measures of acceptability. Test equipment vendors provide ready-to-use compliance test suites which have been used for several years but the reality is that surprises and issues have also been consistent at real silicon making life of post silicon activities quite difficult. Simple traditional designs might not face suffocating issues but in current high speed complex designs, problems (electrical or logical) are inevitable. Unpredictability of such issues impacts cycle time to such an extent that companies have no choice but to delay their date of deliverables which could result in financial or market share loss. To avoid these unexpected problems we need to perform low level testing. This paper describes case studies of some issues which escaped compliance testing and were observed at silicon only after validating the tests given in peripheral checklist. It also elaborates the challenges faced in checklist validation.
  • Keywords
    conformance testing; elemental semiconductors; peripheral interfaces; silicon; system-on-chip; Si; SoC; USB implementer forum; USB peripheral checklist; USB-IF; compliance program; compliance testing; high speed complex designs; ready-to-use compliance test; semiconductor company; silicon; system on chip; test equipment vendors; IEEE Xplore; Portable document format; Peripheral Checklist; System on chip (SoC); USB 2.0 Compliance Testing; USB-IF;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia, Signal Processing and Communication Technologies (IMPACT), 2013 International Conference on
  • Conference_Location
    Aligarh
  • Print_ISBN
    978-1-4799-1202-5
  • Type

    conf

  • DOI
    10.1109/MSPCT.2013.6782119
  • Filename
    6782119