DocumentCode :
1703720
Title :
Radiation hard strip detectors on oxygenated silicon
Author :
Andricek, L. ; Lutz, G. ; Moser, H.G. ; Richter, R.H.
Author_Institution :
Max-Planck-Inst. fur Phys., Munchen, Germany
Volume :
1
fYear :
2001
Firstpage :
573
Abstract :
Recent results of the RD48 (ROSE) collaboration suggest the usage of oxygen enriched silicon for sensors operated in the harsh radiation environment of future high luminosity experiments. To investigate if the anticipated beneficial properties are still present after full processing of the wafers, strip detectors for the innermost ring of the ATLAS forward region have been fabricated on oxygen enriched silicon by CiS, Germany. These sensors, together with sensors on standard and thin substrates, have been exposed to 3·1014 24 GeV/c protons/cm2 at the CERN PS. We are presenting here the comparison between the sensors based on the CV measurements and the investigation of the charge collection efficiency obtained with a 90Sr source and the analogue readout chip SCT128A.
Keywords :
nuclear electronics; p-n junctions; proton effects; radiation hardening (electronics); readout electronics; silicon radiation detectors; 24 GeV; 90Sr; ATLAS; RD48; ROSE; SCT128A; SiO; analogue readout chip; charge collection efficiency; harsh radiation environment; high luminosity experiments; oxygen enriched silicon; oxygenated silicon; proton effects; radiation hard strip detectors; wafers; Charge measurement; Collaboration; Computational Intelligence Society; Current measurement; Measurement standards; Protons; Radiation detectors; Semiconductor device measurement; Silicon radiation detectors; Strips;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2001 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-7324-3
Type :
conf
DOI :
10.1109/NSSMIC.2001.1008522
Filename :
1008522
Link To Document :
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