DocumentCode
1703720
Title
Radiation hard strip detectors on oxygenated silicon
Author
Andricek, L. ; Lutz, G. ; Moser, H.G. ; Richter, R.H.
Author_Institution
Max-Planck-Inst. fur Phys., Munchen, Germany
Volume
1
fYear
2001
Firstpage
573
Abstract
Recent results of the RD48 (ROSE) collaboration suggest the usage of oxygen enriched silicon for sensors operated in the harsh radiation environment of future high luminosity experiments. To investigate if the anticipated beneficial properties are still present after full processing of the wafers, strip detectors for the innermost ring of the ATLAS forward region have been fabricated on oxygen enriched silicon by CiS, Germany. These sensors, together with sensors on standard and thin substrates, have been exposed to 3·1014 24 GeV/c protons/cm2 at the CERN PS. We are presenting here the comparison between the sensors based on the CV measurements and the investigation of the charge collection efficiency obtained with a 90Sr source and the analogue readout chip SCT128A.
Keywords
nuclear electronics; p-n junctions; proton effects; radiation hardening (electronics); readout electronics; silicon radiation detectors; 24 GeV; 90Sr; ATLAS; RD48; ROSE; SCT128A; SiO; analogue readout chip; charge collection efficiency; harsh radiation environment; high luminosity experiments; oxygen enriched silicon; oxygenated silicon; proton effects; radiation hard strip detectors; wafers; Charge measurement; Collaboration; Computational Intelligence Society; Current measurement; Measurement standards; Protons; Radiation detectors; Semiconductor device measurement; Silicon radiation detectors; Strips;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2001 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-7324-3
Type
conf
DOI
10.1109/NSSMIC.2001.1008522
Filename
1008522
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