Title :
IEE Colloquium on `SPICE: Surviving Problems in Circuit Evaluation´ (Digest No.1993/154)
fDate :
6/30/1993 12:00:00 AM
Abstract :
The following topics were dealt with: simulation reliability; nonlinear circuits; convergence; device models; CMOS; communications research; and mixed-technology ICs
Keywords :
SPICE; circuit CAD; convergence of numerical methods; digital simulation; mixed analogue-digital integrated circuits; monolithic integrated circuits; CMOS; communications research; convergence; device models; mixed-technology ICs; nonlinear circuits; simulation reliability;
Conference_Titel :
SPICE: Surviving Problems in Circuit Evaluation, IEE Colloquium on
Conference_Location :
London
