Title :
PENTAG-a Petri net based automatic test pattern generator for sequential digital circuits
Author :
Witts, G. ; Alshahib, I.
Author_Institution :
Sch. of Eng., Oxford Brookes Univ., UK
fDate :
5/28/1993 12:00:00 AM
Abstract :
Describes an automatic test pattern generation program for sequential digital circuits using a modified implementation of Petri nets. This is achieved by the insertion of a FAN transition to the Petri net model. The resultant system compares favourably (12% more coverage and 30% faster) with similar ATPG programs based on the established D-algorithm path sensitization technique
Keywords :
Petri nets; automatic testing; integrated circuit testing; logic testing; sequential circuits; ATPG programs; FAN transition; Petri net; automatic test pattern generator; coverage; sequential digital circuits;
Conference_Titel :
Testing-the Gordian Knot of VLSI Design, IEE Colloquium on
Conference_Location :
London
