• DocumentCode
    1703931
  • Title

    BIST schemes for testing analogue circuits

  • Author

    Learmonth, D.S. ; Russell, G.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Newcastle Upon Tyne Univ., UK
  • fYear
    1993
  • fDate
    5/28/1993 12:00:00 AM
  • Firstpage
    42552
  • Lastpage
    42555
  • Abstract
    To overcome problems associated with testing analogue circuitry two BIST schemes are being investigated. A pragmatic approach to the solution of these problems has been adopted and the techniques developed, which are called residual multiple frequency testing and M-sequencing testing, are discussed
  • Keywords
    analogue circuits; automatic testing; built-in self test; integrated circuit testing; linear integrated circuits; BIST schemes; M-sequencing testing; analogue circuits; residual multiple frequency testing;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Testing-the Gordian Knot of VLSI Design, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    280386
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1703931