Title :
BIST schemes for testing analogue circuits
Author :
Learmonth, D.S. ; Russell, G.
Author_Institution :
Dept. of Electr. & Electron. Eng., Newcastle Upon Tyne Univ., UK
fDate :
5/28/1993 12:00:00 AM
Abstract :
To overcome problems associated with testing analogue circuitry two BIST schemes are being investigated. A pragmatic approach to the solution of these problems has been adopted and the techniques developed, which are called residual multiple frequency testing and M-sequencing testing, are discussed
Keywords :
analogue circuits; automatic testing; built-in self test; integrated circuit testing; linear integrated circuits; BIST schemes; M-sequencing testing; analogue circuits; residual multiple frequency testing;
Conference_Titel :
Testing-the Gordian Knot of VLSI Design, IEE Colloquium on
Conference_Location :
London
