DocumentCode
1704078
Title
IEE Colloquium on `Testing-the Gordian Knot of VLSI Design´ (Digest No.1993/131)
fYear
1993
fDate
5/28/1993 12:00:00 AM
Abstract
The following topics were dealt with: board level testing; BIST; boundary scan testing; ASICs; VHDL; analogue circuits; mixed-signal modules; and Petri net applications
Keywords
VLSI; application specific integrated circuits; automatic testing; boundary scan testing; built-in self test; integrated circuit testing; ASICs; BIST; Petri net applications; VHDL; analogue circuits; board level testing; boundary scan testing; mixed-signal modules;
fLanguage
English
Publisher
iet
Conference_Titel
Testing-the Gordian Knot of VLSI Design, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
280393
Link To Document