DocumentCode
1704103
Title
On the design of a resistive bridging fault testable two-rail checker
Author
Olson, Michael ; Sun, Xiaoling
Author_Institution
Dept. of Electr. Eng., Alberta Univ., Edmonton, Alta., Canada
Volume
1
fYear
1995
Firstpage
124
Abstract
This paper describes the design of a built-in current sensor that is used to enhance the resistive bridging fault detectability of a static CMOS TSC two-rail checker. The design and operation of the sensor is discussed. The performance of the sensor-equipped checker is evaluated and compared to a previously designed checker
Keywords
CMOS digital integrated circuits; built-in self test; electric current; electric resistance; electric sensing devices; integrated circuit testing; built-in current sensor; resistive bridging fault detectability; resistive bridging fault testable two-rail checker; sensor equipped checker; static CMOS TSC two-rail checker; CMOS logic circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic circuits; Logic design; Monitoring; Steady-state; Sun;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering, 1995. Canadian Conference on
Conference_Location
Montreal, Que.
ISSN
0840-7789
Print_ISBN
0-7803-2766-7
Type
conf
DOI
10.1109/CCECE.1995.528090
Filename
528090
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