DocumentCode :
1704115
Title :
Fingerprint Anti-Spoofing Using Ridgelet Transform
Author :
Nikam, Shankar Bhausaheb ; Agarwal, Suneeta
Author_Institution :
Dept. of Comput. Sci. & Eng., Motilal Nehru Nat. Inst. of Tech., Allahabad
fYear :
2008
Firstpage :
1
Lastpage :
6
Abstract :
This paper proposes a new ridgelet transform-based method to detect spoof fingerprint attacks in fingerprint biometric systems. It uses differences in textural characteristics observed in real and spoof fingerprints for spoof detection. Textural measures based on ridgelet energy signatures and ridgelet co-occurrence signatures are used to characterize fingerprint texture. Principal component analysis with ranker search is used to reduce dimensionalities of the feature sets. We test two feature sets independently on three classifiers: neural network, support vector machine and k-nearest neighbor; then we fuse all the classifiers using the "mean rule" to form an ensemble classifier. Classification rates achieved with these classifiers, including an ensemble classifier range from ~92.47% to ~97.41%. Thus, the performance of the new liveness detection method is very promising, as it needs only one fingerprint and no extra hardware to detect vitality.
Keywords :
digital signatures; fingerprint identification; image classification; neural nets; principal component analysis; support vector machines; transforms; ensemble classifier; fingerprint antispoofing; fingerprint biometric systems; fingerprint texture; k-nearest neighbor; liveness detection method; neural network; principal component analysis; ridgelet cooccurrence signatures; ridgelet energy signatures; ridgelet transform; spoof detection; support vector machine; Biometrics; Energy measurement; Fingerprint recognition; Fuses; Hardware; Neural networks; Principal component analysis; Support vector machine classification; Support vector machines; Testing; Biometrics; Fingerprints; Liveness; Ridgelets; Texture features; Wavelets;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biometrics: Theory, Applications and Systems, 2008. BTAS 2008. 2nd IEEE International Conference on
Conference_Location :
Arlington, VA
Print_ISBN :
978-1-4244-2729-1
Electronic_ISBN :
978-1-4244-2730-7
Type :
conf
DOI :
10.1109/BTAS.2008.4699347
Filename :
4699347
Link To Document :
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