Title : 
Modeling the overshooting effect in the submicron CMOS inverters
         
        
            Author : 
Huang, Zhangcai ; Kurokawa, Akira ; Inoue, Yasuyuki
         
        
            Author_Institution : 
Graduate Sch. of Inf., Production & Syst., Waseda Univ., Fukuoka, Japan
         
        
        
        
        
            Abstract : 
The modeling of gate delays has always been one of the most difficult and market-sensitive works. In submicron designs, the second-order effects such as the input-to-output coupling capacitance have a significant influence on gate delay as shown in this paper. However, the accurate analysis of. the input-to-output coupling, capacitance effect has not been presented in previous research. In this paper, an analytical model for the influence of input-to-output coupling capacitance on CMOS inverter delay is proposed, in which a novel algorithm for computing overshooting time is given. Experimental results show good agreement with SPICE simulations.
         
        
            Keywords : 
CMOS logic circuits; capacitance; logic design; logic gates; gate delays; input-to-output coupling capacitance; modeling; overshooting time; second-order effects; submicron CMOS inverters; CMOS technology; Capacitance; Circuit simulation; Computational modeling; Delay effects; Inverters; Production systems; Semiconductor device modeling; Timing; Voltage;
         
        
        
        
            Conference_Titel : 
Communications, Circuits and Systems, 2005. Proceedings. 2005 International Conference on
         
        
            Print_ISBN : 
0-7803-9015-6
         
        
        
            DOI : 
10.1109/ICCCAS.2005.1495321