Title :
Charge-borrowing decap: A novel circuit for removal of local supply noise violations
Author :
Meng, Xiongfei ; Saleh, Resve ; Wilton, Steve
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
Abstract :
We propose a novel circuit called charge-borrowing decap (CBD) as a drop-in replacement for passive decaps to reduce supply noise for removal of ldquohot-spotrdquo IR-drop problems found late in the design process. Measurement results on a 90 nm test chip show that a noise reduction improvement between 42%-55% at 100 MHz-1.5 GHz over its passive counterpart.
Keywords :
integrated circuit design; integrated circuit noise; integrated circuit testing; IR-drop problems; charge-borrowing decap; circuit; drop-in replacement; frequency 100 MHz to 1.5 GHz; hot-spot; local supply noise violations removal; noise reduction; passive decaps; size 90 nm; test chip; Circuit noise; Circuit testing; Noise measurement; Noise reduction; Process design; Semiconductor device measurement;
Conference_Titel :
Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-4071-9
Electronic_ISBN :
978-1-4244-4073-3
DOI :
10.1109/CICC.2009.5280917
