DocumentCode :
1704541
Title :
Application and simulation technology of multichip module packaging
Author :
Yifeng, Chang ; Yintang, Yang
Author_Institution :
Inst. of Microelectron., Xidian Univ., China
Volume :
2
fYear :
2005
Lastpage :
1214
Abstract :
Multichip modules (MCM) allow many bare integrated circuit dies to be mounted onto the top layer, which provides an efficient solution to integration of microelectromechanical systems (MEMS) with microelectronics. The elimination of individual chip packages can significantly reduce inter-chip propagation delay and power consumption of the system. In this paper, new methods of packaging MEMS using advanced MCM foundry processes are described. A special purpose surface micromachined MEMS packaging test chip was designed and simulated. The MEMS test die was packaged with electronics die using the high density interconnect (HDI) technology and the Micro Modules System MCM-D process.
Keywords :
integrated circuit interconnections; integrated circuit packaging; micromachining; micromechanical devices; multichip modules; HDI; Micro Modules System MCM-D process; foundry processes; high density interconnect; integrated circuit dies; inter-chip propagation delay; microelectromechanical systems; microelectronics; micromachined MEMS packaging test chip; multichip module packaging; power consumption; Circuit simulation; Electronic equipment testing; Electronics packaging; Integrated circuit packaging; Integrated circuit technology; Microelectromechanical systems; Microelectronics; Micromechanical devices; Multichip modules; Propagation delay;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications, Circuits and Systems, 2005. Proceedings. 2005 International Conference on
Print_ISBN :
0-7803-9015-6
Type :
conf
DOI :
10.1109/ICCCAS.2005.1495325
Filename :
1495325
Link To Document :
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