DocumentCode
1704541
Title
Application and simulation technology of multichip module packaging
Author
Yifeng, Chang ; Yintang, Yang
Author_Institution
Inst. of Microelectron., Xidian Univ., China
Volume
2
fYear
2005
Lastpage
1214
Abstract
Multichip modules (MCM) allow many bare integrated circuit dies to be mounted onto the top layer, which provides an efficient solution to integration of microelectromechanical systems (MEMS) with microelectronics. The elimination of individual chip packages can significantly reduce inter-chip propagation delay and power consumption of the system. In this paper, new methods of packaging MEMS using advanced MCM foundry processes are described. A special purpose surface micromachined MEMS packaging test chip was designed and simulated. The MEMS test die was packaged with electronics die using the high density interconnect (HDI) technology and the Micro Modules System MCM-D process.
Keywords
integrated circuit interconnections; integrated circuit packaging; micromachining; micromechanical devices; multichip modules; HDI; Micro Modules System MCM-D process; foundry processes; high density interconnect; integrated circuit dies; inter-chip propagation delay; microelectromechanical systems; microelectronics; micromachined MEMS packaging test chip; multichip module packaging; power consumption; Circuit simulation; Electronic equipment testing; Electronics packaging; Integrated circuit packaging; Integrated circuit technology; Microelectromechanical systems; Microelectronics; Micromechanical devices; Multichip modules; Propagation delay;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems, 2005. Proceedings. 2005 International Conference on
Print_ISBN
0-7803-9015-6
Type
conf
DOI
10.1109/ICCCAS.2005.1495325
Filename
1495325
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