• DocumentCode
    1704541
  • Title

    Application and simulation technology of multichip module packaging

  • Author

    Yifeng, Chang ; Yintang, Yang

  • Author_Institution
    Inst. of Microelectron., Xidian Univ., China
  • Volume
    2
  • fYear
    2005
  • Lastpage
    1214
  • Abstract
    Multichip modules (MCM) allow many bare integrated circuit dies to be mounted onto the top layer, which provides an efficient solution to integration of microelectromechanical systems (MEMS) with microelectronics. The elimination of individual chip packages can significantly reduce inter-chip propagation delay and power consumption of the system. In this paper, new methods of packaging MEMS using advanced MCM foundry processes are described. A special purpose surface micromachined MEMS packaging test chip was designed and simulated. The MEMS test die was packaged with electronics die using the high density interconnect (HDI) technology and the Micro Modules System MCM-D process.
  • Keywords
    integrated circuit interconnections; integrated circuit packaging; micromachining; micromechanical devices; multichip modules; HDI; Micro Modules System MCM-D process; foundry processes; high density interconnect; integrated circuit dies; inter-chip propagation delay; microelectromechanical systems; microelectronics; micromachined MEMS packaging test chip; multichip module packaging; power consumption; Circuit simulation; Electronic equipment testing; Electronics packaging; Integrated circuit packaging; Integrated circuit technology; Microelectromechanical systems; Microelectronics; Micromechanical devices; Multichip modules; Propagation delay;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems, 2005. Proceedings. 2005 International Conference on
  • Print_ISBN
    0-7803-9015-6
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2005.1495325
  • Filename
    1495325