• DocumentCode
    1704942
  • Title

    A 1.23pJ/b 2.5Gb/s monolithically integrated optical carrier-injection ring modulator and all-digital driver circuit in commercial 45nm SOI

  • Author

    Moss, B.R. ; Chen Sun ; Georgas, M. ; Shainline, Jeffrey ; Orcutt, Jason S. ; Leu, J.C. ; Wade, Mark ; Yu-Hsin Chen ; Nammari, Kareem ; Xiaoxi Wang ; Hanqing Li ; Ram, Rajeev ; Popovic, Milos A. ; Stojanovic, V.

  • Author_Institution
    Massachusetts Inst. of Technol., Cambridge, MA, USA
  • fYear
    2013
  • Firstpage
    126
  • Lastpage
    127
  • Abstract
    Integrated photonic interconnect technology presents a disruptive alternative to electrical I/O for many VLSI applications. Superior bandwidth-density and energy-efficient operation can be realized through dense wavelength-division multiplexing (DWDM) and lower transmission losses. There are two main paths towards an integrated platform. Hybrid/heterogeneous designs [1-3] enable each component to be custom-tailored, but suffer from large packaging parasitics, increased manufacturing costs due to requisite process flows, and costly 3D integration or microbump packaging. Monolithic integration mitigates integration overheads, but has not penetrated deeply-scaled technologies due to necessary process customizations [4]. The first monolithic integration of photonic devices and electronic-photonic operation in sub-100 nm (45 nm SOI process with zero foundry changes) is demonstrated in [5]. This paper presents a monolithically integrated optical modulator with a new all-digital driver circuit in a commercial 45nm SOI process. The waveform-conditioning driver circuit enables the carrier-injection modulator to operate at 2.5Gb/s with an energy-cost of 1.23pJ/b, making it ~4× faster and more energy-efficient than the previous monolithically integrated driver/modulator presented in [5].
  • Keywords
    driver circuits; integrated optoelectronics; optical interconnections; optical modulation; silicon-on-insulator; 3D integration; DWDM; SOI process; VLSI; all-digital driver circuit; bandwidth-density; bit rate 2.5 Gbit/s; carrier-injection modulator; dense wavelength-division multiplexing; electrical I/O applications; electronic-photonic operation; energy-efficient operation; hybrid-heterogeneous designs; integrated photonic interconnect technology; manufacturing costs; microbump packaging; monolithically integrated optical carrier-injection ring modulator; packaging parasitics; photonic device integration; size 45 nm; transmission losses; waveform-conditioning driver circuit; Driver circuits; Extinction ratio; Integrated optics; Optical device fabrication; Optical losses; Optical modulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2013 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-4673-4515-6
  • Type

    conf

  • DOI
    10.1109/ISSCC.2013.6487666
  • Filename
    6487666