Title :
Probeless electrical fault isolation approach: a breakthrough logic and circuit simulation based failure analysis method
Author :
Lim, Sin Liang ; Wong, Y.C. ; Mak, M.W.
Author_Institution :
Microprocessor Failure Anal. Intel Malaysia, Penang, Malaysia
Abstract :
Probeless electrical fault isolation is a breakthrough approach that developed to enable failure analysis (FA) on advanced microprocessor without the need of probing equipment. In addition to cost saving, a higher success rate and shorter analysis time is clearly demonstrated.
Keywords :
circuit simulation; electrical faults; failure analysis; integrated circuit testing; isolation technology; logic simulation; microprocessor chips; circuit simulation; failure analysis method; logic simulation; microprocessor; probeless electrical fault isolation; Circuit faults; Circuit simulation; Electron beams; Failure analysis; Isolation technology; Logic circuits; Microprocessors; Out of order; Semiconductor device packaging; Transistors;
Conference_Titel :
Semiconductor Electronics, 2004. ICSE 2004. IEEE International Conference on
Print_ISBN :
0-7803-8658-2
DOI :
10.1109/SMELEC.2004.1620944
