DocumentCode :
1705074
Title :
Performance analysis of dual-hop variable gain relay networks over Generalized-K fading channels
Author :
Waqar, Omer ; Ghogho, Mounir ; McLernon, Des
Author_Institution :
Sch. of Electron. & Electr. Eng., Univ. of Leeds, Leeds, UK
fYear :
2010
Firstpage :
1
Lastpage :
5
Abstract :
In this paper, we develop a new and comprehensive analytical framework for the performance analysis of variable gain dual-hop relay networks over generalized-K fading channels which are typically encountered in composite fading/shadowing environments. We propose a new and generic approach for deriving the closed-form expressions of the ergodic capacity1 of the dual-hop networks with variable gain relays considering a Generalized-K fading and its specific case of Nakagami-m fading. Furthermore, we show that at high average end-to-end signal-to-noise ratio (SNR), the average symbol error probability (ASEP) of the dual-hop variable gain relay network over Generalized-K fading channels can be closely approximated by the sum of the ASEP´s of the two same single input single output (SISO) systems. Finally, we also derive a new closed-form expression of the moments of an upper-bound of the end-to-end SNR. Monte-Carlo simulations are also provided in order to validate the analytical framework.
Keywords :
Monte Carlo methods; Nakagami channels; fading channels; Monte-Carlo simulations; Nakagami-m fading; average end-to-end signal-to-noise ratio; average symbol error probability; closed-form expressions; dual-hop networks; dual-hop variable gain relay networks; ergodic capacity; generalized-K fading channels; single input single output systems; variable gain dual-hop relay networks; Closed-form solution; Fading; Gain; Performance analysis; Relays; Shadow mapping; Signal to noise ratio; Average Symbol Error Probability (ASEP); Ergodic Capacity; Generalized-K fading; Meijer G and Lommel functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Processing Advances in Wireless Communications (SPAWC), 2010 IEEE Eleventh International Workshop on
Conference_Location :
Marrakech
ISSN :
1948-3244
Print_ISBN :
978-1-4244-6990-1
Electronic_ISBN :
1948-3244
Type :
conf
DOI :
10.1109/SPAWC.2010.5671081
Filename :
5671081
Link To Document :
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