DocumentCode
170512
Title
A new metrics selection method for software defect prediction
Author
Ye Xia ; Guoying Yan ; Xingwei Jiang ; Yanyan Yang
Author_Institution
Beijing Inst. of Tracking & Telecommun. Technol., Beijing, China
fYear
2014
fDate
16-18 May 2014
Firstpage
433
Lastpage
436
Abstract
In the case of metrics-based software defect prediction, an intelligent selection of metrics is one of the key factors that affect the model performance. To solve the problem that only the correlation between software metrics is considered and the issue of redundance is tend to be ignored in the current studies, a new algorithm which combines ReliefF feature selection algorithm and correlation analysis is proposed. An experiment via 3 different classifiers over classic data sets from PROMISE repository is carried out, which is compared to the other two well-known feature selection algorithms. The ANOVA (Analysis of Variance) analysis shows that, a new method called ReliefF-LC (a fusion algorithm based on ReliefF and linear correlation analysis) feature selection algorithm can improve defect prediction performance.
Keywords
feature selection; program testing; software metrics; statistical analysis; ANOVA; PROMISE repository; ReliefF feature selection algorithm; ReliefF-LC; analysis of variance; defect prediction performance; fusion algorithm; intelligent metrics selection; linear correlation analysis; metrics-based software defect prediction; software metrics; software testing; Classification algorithms; Correlation; Prediction algorithms; Software; Software algorithms; Software metrics; defect prediction; feature selection; redundance; relevance; software metric;
fLanguage
English
Publisher
ieee
Conference_Titel
Progress in Informatics and Computing (PIC), 2014 International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4799-2033-4
Type
conf
DOI
10.1109/PIC.2014.6972372
Filename
6972372
Link To Document