DocumentCode :
170512
Title :
A new metrics selection method for software defect prediction
Author :
Ye Xia ; Guoying Yan ; Xingwei Jiang ; Yanyan Yang
Author_Institution :
Beijing Inst. of Tracking & Telecommun. Technol., Beijing, China
fYear :
2014
fDate :
16-18 May 2014
Firstpage :
433
Lastpage :
436
Abstract :
In the case of metrics-based software defect prediction, an intelligent selection of metrics is one of the key factors that affect the model performance. To solve the problem that only the correlation between software metrics is considered and the issue of redundance is tend to be ignored in the current studies, a new algorithm which combines ReliefF feature selection algorithm and correlation analysis is proposed. An experiment via 3 different classifiers over classic data sets from PROMISE repository is carried out, which is compared to the other two well-known feature selection algorithms. The ANOVA (Analysis of Variance) analysis shows that, a new method called ReliefF-LC (a fusion algorithm based on ReliefF and linear correlation analysis) feature selection algorithm can improve defect prediction performance.
Keywords :
feature selection; program testing; software metrics; statistical analysis; ANOVA; PROMISE repository; ReliefF feature selection algorithm; ReliefF-LC; analysis of variance; defect prediction performance; fusion algorithm; intelligent metrics selection; linear correlation analysis; metrics-based software defect prediction; software metrics; software testing; Classification algorithms; Correlation; Prediction algorithms; Software; Software algorithms; Software metrics; defect prediction; feature selection; redundance; relevance; software metric;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Progress in Informatics and Computing (PIC), 2014 International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4799-2033-4
Type :
conf
DOI :
10.1109/PIC.2014.6972372
Filename :
6972372
Link To Document :
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