DocumentCode
1705220
Title
"Hallucinating Irises" - Dealing with Partial & Occluded Iris Regions
Author
Munemoto, Taihei ; Li, Yung-hui ; Savvides, Marios
Author_Institution
Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA
fYear
2008
Firstpage
1
Lastpage
6
Abstract
In this paper, we examine a novel image-filling algorithm to fill the occluded and partial regions of the iris. In iris recognition, these occlusions naturally appear due to eye-lids being partially closed, eye movements and eye-lashes. Additionally, specular reflections arising from the iris-camera illuminator are present and produce occlusion artifacts on the iris region. In the polar representation of iris images, additional ´nuisance´ parameters include image regions containing the pupil and sclera due to inaccurate iris segmentations. Thus, for accurate iris recognition, it is important to reduce the effect of these nuisance parameters so that the performance of the iris recognition system can be maximized. Typically, a mask region (automatic or manual) is defined to ignore occluded or affected iris regions from such nuisance artifacts. However, in the feature extraction stage, especially using Gabor type extraction, the features near the edge of these artifacts are also affected due to the tail supports of these filters that overflow on occluded irises. We propose a novel method for filling in the occluded regions by synthesizing the iris pattern from this current exemplar image and show that a significant improvement on the Iris Challenge Evaluation (ICE) dataset can be made.
Keywords
feature extraction; image recognition; image segmentation; Gabor type extraction; feature extraction; image-filling algorithm; iris challenge evaluation; iris recognition; iris segmentations; occluded iris regions; partial iris regions; Biometrics; Eyelids; Feature extraction; Gabor filters; Image databases; Image segmentation; Iris recognition; Noise figure; Reflection; Waveguide discontinuities;
fLanguage
English
Publisher
ieee
Conference_Titel
Biometrics: Theory, Applications and Systems, 2008. BTAS 2008. 2nd IEEE International Conference on
Conference_Location
Arlington, VA
Print_ISBN
978-1-4244-2729-1
Electronic_ISBN
978-1-4244-2730-7
Type
conf
DOI
10.1109/BTAS.2008.4699387
Filename
4699387
Link To Document